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Kawabori, Tatsuru*; Watanabe, Masashi; Imai, Yoshiyuki; Ueta, Shohei; Yan, X.; Mizoshiri, Mizue*
Applied Physics A, 129(7), p.498_1 - 498_9, 2023/07
Times Cited Count:0 Percentile:0(Materials Science, Multidisciplinary)We investigated a potential of femtosecond laser sintering of silicon carbide (SiC) using the nanoparticles in air. A SiC nanoparticle ink including polyvinylpyrrolidone and ethylene glycol exhibited intense absorption by SiC nanoparticles at the wavelength of 780 nm. The whole of the sintered film patterns from the surface to the bottom underwent significant oxidation at a scanning speed of 1 mm/s, suggesting that the excessive energy irradiation generated silicon oxides. In contrast, the patterns fabricated by laser scanning at a raster pitch of 30 m at which a sintered area was observed at a scanning speed of 5 mm/s, exhibited no significant difference in oxidation of the raw SiC nanoparticles except for the surfaces from 1.72 m. These results indicate that the irradiation of femtosecond laser pulses generated the sintered SiC patterns without additional atmospheric oxidation of the raw materials because of its low heat accumulation. In additions, the dispersant of polyvinylpyrrolidone and ethylene glycol did not affect the sintering by an X-ray photoelectron spectroscopy. This vacuum-free direct printing technique has the potential for additive manufacturing.
Oshima, Takeshi; Yokoseki, Takashi; Murata, Koichi; Matsuda, Takuma; Mitomo, Satoshi; Abe, Hiroshi; Makino, Takahiro; Onoda, Shinobu; Hijikata, Yasuto*; Tanaka, Yuki*; et al.
Japanese Journal of Applied Physics, 55(1S), p.01AD01_1 - 01AD01_4, 2016/01
Times Cited Count:14 Percentile:54.92(Physics, Applied)Taguchi, Tomitsugu; Yamamoto, Shunya; Kodama, Katsuaki; Asaoka, Hidehito
Carbon, 95, p.279 - 285, 2015/12
Times Cited Count:11 Percentile:35.58(Chemistry, Physical)Amorphous SiC nanotubes are successfully synthesized by 340 keV Si ions irradiation of polycrystalline SiC nanotubes for the first time. A polycrystalline/amorphous heterostructure SiC nanotube, in which polycrystalline SiC and amorphous SiC coexist in the same nanotube, is also synthesized by ions irradiation with a mask in front of polycrystalline SiC nanotube. According to electron energy loss spectroscopy evaluation, the plasmon energies of SiC nanotube change rapidly at the interface between polycrystalline and amorphous regions. The volume swelling by amorphization evaluated from the differences of plasmon energies is approximately 5.0%. This result reveals that the further relaxed amorphous SiC nanotubes with higher density can be produced. The graphitic shells in carbon layer of C-SiC nanotube gradually bend to the radial direction of nanotube by the ion irradiation. Since the graphite (002) spots in the selected area electron diffraction pattern are clearly observed even after the ion irradiation, the carbon layer in C-SiC nanotube has certain crystallinity. Moreover, the new multi-walled carbon nanotube with the graphitic shells completely parallel to the radial direction of nanotube is also produced inside the amorphous SiC tubular layer in the case of C-SiC nanotube with large caliber.
Takeyama, Akinori; Matsuda, Takuma; Yokoseki, Takashi; Mitomo, Satoshi; Murata, Koichi; Makino, Takahiro; Onoda, Shinobu; Tanaka, Yuki*; Kandori, Mikio*; Yoshie, Toru*; et al.
Proceedings of 11th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-11) (Internet), p.134 - 137, 2015/11
Iwamoto, Naoya*; Azarov, A.*; Oshima, Takeshi; Moe, A. M. M.*; Svensson, B. G.*
Journal of Applied Physics, 118(4), p.045705_1 - 045705_8, 2015/07
Times Cited Count:6 Percentile:27.03(Physics, Applied)Lohrmann, A.*; Iwamoto, Naoya*; Bodrog, Z.*; Castelletto, S.*; Oshima, Takeshi; Karle, T. J.*; Gali, A.*; Prawer, S.*; McCallum, J. C.*; Johnson, B. C.*
Nature Communications (Internet), 6, p.7783_1 - 7783_7, 2015/07
Times Cited Count:143 Percentile:96.84(Multidisciplinary Sciences)Pastuovi, *; Capan, I.*; Cohen, D.*; Forneris, J.*; Iwamoto, Naoya*; Oshima, Takeshi; Siegele, R.*; Hoshino, Norihiro*; Tsuchida, Hidekazu*
Nuclear Instruments and Methods in Physics Research B, 348, p.233 - 239, 2015/04
Times Cited Count:7 Percentile:51.25(Instruments & Instrumentation)Son, N. T.*; Umeda, Takahide*; Isoya, Junichi*; Gali, A.*; Bockstedte, M.*; Magnusson, B.*; Ellison, A.*; Morishita, Norio; Oshima, Takeshi; Ito, Hisayoshi; et al.
Physica B; Condensed Matter, 376-377, p.334 - 337, 2006/04
Times Cited Count:3 Percentile:17.99(Physics, Condensed Matter)no abstracts in English
Matsuura, Hideharu*; Kagamihara, So*; Ito, Yuji*; Oshima, Takeshi; Ito, Hisayoshi
Physica B; Condensed Matter, 376-377, p.342 - 345, 2006/04
Times Cited Count:8 Percentile:38.44(Physics, Condensed Matter)no abstracts in English
Matsuura, Hideharu*; Kagamihara, So*; Ito, Yuji*; Oshima, Takeshi; Ito, Hisayoshi
Microelectronic Engineering, 83(1), p.17 - 19, 2006/01
Times Cited Count:3 Percentile:24.47(Engineering, Electrical & Electronic)no abstracts in English
Pensl, G.*; Ciobanu, F.*; Frank, T.*; Kirmse, D.*; Krieger, M.*; Reshanov, S.*; Schmid, F.*; Weidner, M.*; Oshima, Takeshi; Ito, Hisayoshi; et al.
Microelectronic Engineering, 83(1), p.146 - 149, 2006/01
Times Cited Count:15 Percentile:59.32(Engineering, Electrical & Electronic)no abstracts in English
Oshima, Takeshi; Sato, Takahiro; Oikawa, Masakazu*; Onoda, Shinobu; Hirao, Toshio; Ito, Hisayoshi
Materials Science Forum, 527-529, p.1347 - 1350, 2006/00
Charge induced in 6H-SiC pn diodes by oxygen ion microbeams was examined in an energy range between 6 and 18 MeV. To minimize the influence of damage, single ion hit Transient Ion Beam Induced Current (TIBIC) measurement system, in which the transient current induced by single ion incidence can be measured, was used in this study. The value of charge increases with increasing reverse applied bias, and the saturation of charge is observed when the depletion layer becomes longer than ion range. An increase of collected charge by the funneling effect (the generation of a transient electric filed) is observed in the case of the depletion layer shorter than ion range. The charge collection efficiency is estimated to be 100 % in the saturation region (the depletion layer longer than ion range). It strongly suggests that high quality particle detectors are fabricated using SiC.
Isoya, Junichi*; Katagiri, Masayuki*; Umeda, Takahide*; Son, N. T.*; Henry, A.*; Gali, A.*; Morishita, Norio; Oshima, Takeshi; Ito, Hisayoshi; Janzn, E.*
Materials Science Forum, 527-529, p.593 - 596, 2006/00
no abstracts in English
Son, N. T.*; Umeda, Takahide*; Isoya, Junichi*; Gali, A.*; Bockstedte, M.*; Magnusson, B.*; Ellison, A.*; Morishita, Norio; Oshima, Takeshi; Ito, Hisayoshi; et al.
Materials Science Forum, 527-529, p.527 - 530, 2006/00
no abstracts in English
Oshima, Takeshi; Sato, Takahiro; Oikawa, Masakazu*; Yamakawa, Takeshi; Onoda, Shinobu; Wakasa, Takeshi; Laird, J. S.; Hirao, Toshio; Kamiya, Tomihiro; Ito, Hisayoshi; et al.
Nuclear Instruments and Methods in Physics Research A, 541(1-2), p.236 - 240, 2005/04
Times Cited Count:9 Percentile:55.97(Instruments & Instrumentation)In order to develop particle detectors based on SiC semiconductor, SiC pn-diodes were irradiated with microbeam of 15MeV oxygen ions. The transient current was measured using the single ion hit transient ion beam induced current (TIBIC) system at TIARA. As the results, peak intensity of transient current induded by ion irradiation increased and falltime decreased with increasing applied bias. By the integration of transient current, the charge collection was estimated. It was found that charges generated in deeper region beyond the depletion layer can be collected by the funneling effect.
Oshima, Takeshi
Hoshasen To Sangyo, (105), p.12 - 18, 2005/03
no abstracts in English
Taguchi, Tomitsugu; Igawa, Naoki; Yamada, Reiji; Jitsukawa, Shiro
Journal of Physics and Chemistry of Solids, 66(2-4), p.576 - 580, 2005/02
Times Cited Count:51 Percentile:84.09(Chemistry, Multidisciplinary)SiC/SiC composites are expected to be one of the candidate materials for fusion reactors because of the low radioactivity after neutron irradiation and excellent mechanical properties at high temperature. Reaction-Bonding (RB) process was employed since this process has a possibility of producing a much denser matrix compared with other processes. SiC fibers, however, adhere strongly to the matrix because of high reactiveness of molten Si with the SiC fiber during RB process. In this study, we investigated the effects of SiC layer as an interphase on fracture behavior in the SiC/SiC. The specimen without an interphase layer showed catastrophic failure behavior while the specimen with SiC interphase layer exhibited non-catastrophic failure behavior by 3-point bending testing. The microstructure observation indicated that SiC fibers did not adhere to the matrix in the specimen with SiC interpahse layer. After 3-point bending testing, the pull-out phenomenon occurred in the SiC/SiC with SiC interphase layer while did not occur in the composite without interphase layer.
Umeda, Takahide*; Isoya, Junichi*; Morishita, Norio; Oshima, Takeshi; Kamiya, Tomihiro; Gali, A.*; Dek, P.*; Son, N. T.*; Janzn, E.*
Physical Review B, 70(23), p.235212_1 - 235212_6, 2004/12
Times Cited Count:44 Percentile:83.59(Materials Science, Multidisciplinary)no abstracts in English
Weidner, M.*; Pensl, G.*; Nagasawa, Hiroyuki*; Schner, A.*; Oshima, Takeshi
Materials Science Forum, 457-460, p.485 - 488, 2004/10
no abstracts in English
Oshima, Takeshi; Ito, Hisayoshi
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.191 - 194, 2004/10
no abstracts in English